ATTACHMENT FOR THE DETECTION OF SPATIALLY RESOLVED EMISSION FROM LOW TEMPERATURE MATRICES

This device enables convenient investigation of local matrix inhomogeneities. The examined fragment has a diameter of about 2 mm. The attachment consists of two quarz lenses in a special, regulated casing. Investigations of the emission in the range 190-1100 nm are possible from selected areas of arbitrarily (spatially) oriented matrix M placed in a Displex type of a cryostat. The spectra are measured by a CCD camera (Princeton Instruments) coupled with a spectrograph (Acton SpectraPro 275). Light is led to the spectrograph through an optical fibre. The attachment is equiped with a red diode laser, which, when placed in the place of the optical fibre, makes possible precise determination of the examined fragment of matrix.  Using two screws, one can select the spot P of observation on the matrix. These screws move the optical system in x and y directions, perpendicular to the optical axis. Spot P can be moved in the field of about 17 mm. After setting the place of observation and  focusing the light spot from the diode laser on the matrix (by moving diode F along the optical axis z), laser radiation L with suitable wavelength, polarization and angle of incidence is directed on the observation spot. Last step of justifying procedure is replacing of diode laser F with the optical fibre.